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Mechanical Response of Thermally Annealed Nafion Thin Films

机译:热退火Nafion薄膜的机械响应

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摘要

Perfluorinated ionomers, in particular, Nafion, are a critical component in hydrogen fuel cells as the ion conducting binder within the catalyst layer in which it can be confined to thicknesses on the order of 10 nm or less. It is well reported that many physical properties, such as the Young's modulus, are thickness dependent when the film thickness is less than 100 nm. Here we utilize a cantilever bending methodology to quantify the swelling-induced stresses and relevant mechanical properties of Nafion films as a function of film thickness exposed to cyclic humidity. We observe a factor of 5 increase in the Young's modulus in films thinner than 50 nm and show how this increased stiffness translates to reduced swelling or hydration. The swelling stress was found to increase by a factor of 2 for films approximately 40 nm thick. We demonstrate that thermal annealing enhances the modulus at all film thicknesses and correlate these mechanical changes to chemical changes in the infrared absorption spectra.
机译:全氟化离聚物,特别是Nafion,是氢燃料电池中的关键组分,作为催化剂层内的离子导电粘合剂,在其中可以将其限制在10 nm或更小的厚度。众所周知,当膜厚度小于100 nm时,许多物理性质(例如杨氏模量)与厚度有关。在这里,我们利用悬臂弯曲方法来定量Nafion薄膜的膨胀诱导应力和相关的机械性能,作为暴露于循环湿度下的薄膜厚度的函数。我们观察到小于50 nm的薄膜的杨氏模量增加了5倍,并显示出这种增加的刚度如何转化为减少的溶胀或水合作用。发现大约40 nm厚的薄膜的溶胀应力增加了2倍。我们证明,热退火可以提高所有膜厚度下的模量,并使这些机械变化与红外吸收光谱中的化学变化相关。

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