X-ray diffraction study of langasite film grown by liquid phase epitaxy

摘要

Langasite (La_3Ga_5SiO_(14), LGS) and its alloy systems represent a novel class of piezoelectric materials for frequency control applications [1-5]. Previously we have reported the liquid phase epitaxy (LPE) growth of crystalline LGS film [6]. We have extensively investigated LPE growth parameters such as flux systems including KCl, NaOH, Bi_2O_3, and PbO as well as various substrates for epitaxial langastite film growth. We have demonstrated that reasonable quality epitaxial LGS films can be grown on spinel substrate utilizing a eutectic PbO:Bi_2O_3 flux system.