Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study

摘要

The porous metal organic framework, MOF, [Cu_2(l,4-naphtalenedicarboxylate)_2(l,4-diazabicyclo[2.2.2]octane)]_n has been chosen as a suitable model to investigate the principals of continuous thin film deposition from solution. A layer by-layer cyclic procedure was applied for the controlled epitaxial growth of MOFs on the gold-surface modified with pyridyl-terminated self-assembled monolayers on gold sub strates. Different methods were used to analyse the influence of different parameters f (such as temperature, concentration, number of washing cycles etc.) on the film thickness and minimize the "storage effect". The films obtained were ideally oriented in the [0 0 1] crystal lographic direction and covered the whole surface. Single-line profile analysis of the X-ray diffraction patterns was subsequently used for film thickness characterization. The thickness linearly increased with the number of deposition cycles. This fact suggests the self terminated growing mechanism for the resulted films.