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Effect of Microstructure on Electrical and Optical Properties of ITO Thin Film Deposited by D.C. Magnetron Sputtering (II)

机译:微结构对直流磁控溅射沉积ITO薄膜电学和光学性能的影响(II)

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摘要

The electrical and the optical properties were investigated to find the optimum microstructure of ITO thin films deposited by D.C. magnetron sputtering. Carrier concentration and carrier mobility of ITO thin films were measured, the transmittance of them also was done. As O_2 flow rate and substrate temperature increased, the transmittance of ITO thin film increased because ITO particles formed coarse and good crystalline. The sheet resistance was the minimum at O_2 flow rate, 0.3 sccm, and the minimum value was 9OMEGA/square at substrate temperature, 350 deg C. The electrical and the optical properties of ITO thin film depended on the morphology and the crystallinity.
机译:研究了电学和光学性能,以找到通过直流磁控溅射沉积的ITO薄膜的最佳微观结构。测量了ITO薄膜的载流子浓度和载流子迁移率,并进行了透射率测试。随着O_2流量和基板温度的升高,ITO薄膜的透射率增加,因为ITO颗粒形成了粗糙且良好的晶体。在O 2流量下,薄层电阻最小,为0.3 sccm,在衬底温度为350℃时,最小值为9OMEGA /平方。ITO薄膜的电学和光学性质取决于形貌和结晶度。

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