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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Peracetic acid as active species in mixtures for selective etching of SiGe/Si layer systems - Aspects of chemistry and analytics
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Peracetic acid as active species in mixtures for selective etching of SiGe/Si layer systems - Aspects of chemistry and analytics

机译:过乙酸作为混合物中的活性物质,用于选择性刻蚀SiGe / Si层系统-化学和分析学方面

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摘要

The ever increasing demand for faster computers has exhausted the capabilities of silicon as the basic material for chip production. This is due to the physical limits of silicon itself and can only be overcome by switching to another material. Until this problem is solved a variant of the normal silicon, called "strained silicon" (sSi) is used. In the production of sSOI-wafers (strained silicon on insulator) an intermediate SiGe/sSi layer system is created (Figure 1) from which the SiGe layer is then removed to expose the strained silicon layer.
机译:对更快计算机的不断增长的需求已经耗尽了硅作为芯片生产基本材料的功能。这是由于硅本身的物理限制,只能通过切换到另一种材料来克服。在解决此问题之前,使用一种称为“应变硅”(sSi)的普通硅的变体。在sSOI晶片(绝缘体上的应变硅)的生产中,创建了一个中间SiGe / sSi层系统(图1),然后从该系统中去除了SiGe层以暴露应变硅层。

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