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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Growth, optical absorption and resistivity of (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 single crystals
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Growth, optical absorption and resistivity of (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 single crystals

机译:(Ga_(0.6)In_(0.4))_ 2Se_3和(Ga_(0.594)In_(0.396)Er_(0.01))_ 2Se_3单晶的生长,光吸收和电阻率

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摘要

The phase diagram of the Ga_2Se_3-In_2Se_3 system was investigated by differential-thermal analysis (DTA) and X-ray diffraction (XRD) method. The single crystals from the area of existence of the γ2 phase with the compositions (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 were grown by a vertical Bridgman method. Absorption spectra of the grown crystals were studied. The estimated optical band gap is 1.95±0. 01 eV. The resistance of the single crystals of (Ga_(0.6)In_(0.4))_2Se_3 (R=500 MΩ) and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 (R=210 MΩ) was measured.
机译:通过差热分析(​​DTA)和X射线衍射(XRD)方法研究了Ga_2Se_3-In_2Se_3系统的相图。通过垂直布里奇曼法生长具有(Ga_(0.6)In_(0.4))_ 2Se_3和(Ga_(0.594)In_(0.396)Er_(0.01))_ 2Se_3组成的γ2相存在区域的单晶。研究了生长晶体的吸收光谱。估计的光学带隙为1.95±0。 01 eV。测定了(Ga_(0.6)In_(0.4))_ 2Se_3(R =500MΩ)和(Ga_(0.594)In_(0.396)Er_(0.01))_ 2Se_3(R =210MΩ)的单晶的电阻。

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