首页> 外文会议>International scientific conference on oxide materials for electronic engineering - fabrication, properties and applications >Growth, Optical Absorption and Resistivity of (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 Single Crystals
【24h】

Growth, Optical Absorption and Resistivity of (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 Single Crystals

机译:(Ga_(0.6)In_(0.4))_ 2Se_3和(Ga_(0.594)In_(0.396)Er_(0.01))_ 2Se_3单晶的生长,光吸收和电阻率

获取原文

摘要

The phase diagram of the Ga_2Se_3-In_2Se_3 system was investigated by differential-thermal analysis (DTA) and X-ray diffraction (XRD) method. The single crystals from the area of existence of the γ_2 phase with the compositions (Ga_(0.6)In_(0.4))_2Se_3 and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 were grown by a vertical Bridgman method. Absorption spectra of the grown crystals were studied. The estimated optical band gap is 1.95±0. 01 eV. The resistance of the single crystals of (Ga_(0.6)In_(0.4))_2Se_3 (R=500 MΩ) and (Ga_(0.594)In_(0.396)Er_(0.01))_2Se_3 (R=210 MΩ) was measured.
机译:通过差分 - 热分析(DTA)和X射线衍射(XRD)方法研究了GA_2SE_3-IN_2SE_3系统的相图。来自γ_2相的存在区域的单晶(Ga_2)_ 2Se_3和(Ga_(0.594)IN_(0.396)ER_(0.01))_ 2Se_3被垂直的Bridgman方法生长。研究了生长晶体的吸收光谱。估计的光带隙是1.95±0。 01 ev。测量单晶(Ga_(0.6)IN_(0.4))_ 2SE_3(R =500MΩ)和(GA_(0.594)IN_(0.396)ER_(0.01))_ 2SE_3(r =210mΩ)的单晶的电阻。

著录项

相似文献

  • 外文文献
  • 中文文献
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号