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首页> 外文期刊>Journal of Electronic Materials >Electrical Conductivity of Graphene Composites with In and In-Ga Alloy
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Electrical Conductivity of Graphene Composites with In and In-Ga Alloy

机译:In和In-Ga合金的石墨烯复合材料的电导率

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摘要

Samples of composites of graphene with indium or indium-gallium alloy as the matrix were prepared by a process of spreading exfoliated graphene oxide on the foils, repeatedly folding and rolling. The foils were intermittently annealed and the process repeated by addition of more graphene oxide. Indium flux was used to remove any indium or gallium oxide. The samples were characterized by x-ray diffraction, and optical and scanning electron microscopy (SEM). Electrical resistivity and temperature coefficient of resistance (TCR) were measured using a four-probe method in the temperature range of 260 K to 340 K, and the results were used to determine the volume fraction of graphene from effective mean-field analysis. The volume fraction of graphene remained between 0.11 and 0.14 in samples of In with graphene and between 0.12 and 0.13 in samples of In-Ga with graphene. The results indicate that the electrical resistivity and the TCR of the composite were reduced by the addition of graphene. The resistivity of graphene remained between 1.19 X 10~(-6) ohm cm and 1.87 X 10~(-6) ohm cm in all samples and was thus almost independent of the matrix composition. The electrical resistivity of graphene was found to be an order of magnitude smaller than that of indium or the indium-gallium alloy.
机译:石墨烯与铟或铟镓合金为基体的复合材料样品是通过将剥落的氧化石墨烯散布在箔上,反复折叠和轧制的过程中制备的。将箔间歇地退火,并通过添加更多的氧化石墨烯来重复该过程。铟助熔剂用于去除任何铟或镓的氧化物。通过X射线衍射,光学和扫描电子显微镜(SEM)对样品进行表征。使用四探针法在260 K至340 K的温度范围内测量电阻率和电阻温度系数(TCR),并将结果用于通过有效的平均场分析确定石墨烯的体积分数。在带有石墨烯的In样品中,石墨烯的体积分数保持在0.11至0.14之间,在带有石墨烯的In-Ga样品中,石墨烯的体积分数保持在0.12至0.13之间。结果表明,石墨烯的加入降低了复合材料的电阻率和TCR。在所有样品中,石墨烯的电阻率保持在1.19 X 10〜(-6)ohm cm和1.87 X 10〜(-6)ohm cm之间,因此几乎与基质组成无关。发现石墨烯的电阻率比铟或铟-镓合金的电阻率小一个数量级。

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