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首页> 外文期刊>Journal of Electronic Materials >Depletion-Mode Photoconductivity Study of Deep Levels in GaN Nanowires
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Depletion-Mode Photoconductivity Study of Deep Levels in GaN Nanowires

机译:GaN纳米线中深能级的耗尽型光电导研究

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摘要

The steady-state photoconductivity (PC) response of deep level defects to sub-bandgap illumination was studied in GaN nanowires (NWs) grown by metalorganic chemical vapor deposition. Photoemission from defects residing in the NW surface depletion region alters the depletion width, and the PC response arises mainly from the resulting enhancement of the cross-sectional area of the electrically conductive NW core. The advantages of emphasizing depletion region processes for deep level spectroscopy of NWs are discussed. A simple electrostatic model was adopted to explain the strong relative increase of sub-bandgap PC response with decreasing NW width. NW deep level spectra were similar to those widely reported for planar GaN films, suggesting that the corresponding defects are located throughout the NW volume and are not specific to the surface.
机译:研究了金属有机化学气相沉积法生长的GaN纳米线(NW)中深层缺陷对亚带隙照明的稳态光电导(PC)响应。来自残留在NW表面耗尽区中的缺陷的光发射改变了耗尽宽度,并且PC响应主要来自导电NW芯的横截面面积的所得增大。讨论了在NW的深层光谱中强调耗尽区过程的优势。采用简单的静电模型来解释随着NW宽度的减小,子带隙PC响应的强烈相对增加。 NW深能级光谱与平面GaN膜广泛报道的光谱相似,这表明相应的缺陷位于整个NW体积中,而不是特定于表面。

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