首页> 外文会议>ICPS 2012 >Persistent Photoconductivity in AlGaN/GaN Heterojunction Channels Caused by the Ionization of Deep Levels in the AlGaN Barrier Layer
【24h】

Persistent Photoconductivity in AlGaN/GaN Heterojunction Channels Caused by the Ionization of Deep Levels in the AlGaN Barrier Layer

机译:AlGaN / GaN异质结的持续光电导率由AlGaN阻挡层中深度水平的电离引起的

获取原文

摘要

Time-dependent responses of drain current (Id) in an AlGaN/GaN HEMT under UV (3.3 eV) and red (2.0 eV) light illumination have been studied at 300 K and 250 K. UV illumination enhances Id by about 10 %, indicating that the density of two-dimensional electrons is raised by about 10~(12) cm~(-2). When UV light is turned off at 300 K, a part of increased I_d decays quickly but the other part of increment is persistent, showing a slow decay. At 250 K, the majority of increment remains persistent. It is found that such a persistent increase of Id at 250 K can be partially erased by the illumination of red light. These photo-responses are explained by a simple band-bending model in which deep levels in the AlGaN barrier get positively charged by the UV light, resulting in a parabolic band bending in the AlGaN layer, while some potion of those deep levels are neutralized by the red light.
机译:在UV(3.3eV)和红色(2.0eV)下的AlGaN / GaN HEMT中的漏极电流(ID)的时间依赖性响应已经在300k和250k中进行了300 k和250k。UV照明增强ID约10%,表明二维电子的密度升高约10〜(12 )cm〜(-2)。当UV灯在300 k下关闭时,一部分增加的I_D衰减衰减,但增量的另一部分是持久的,显示缓慢衰减。在250 k处,大部分增量仍然存在。结果发现,在250k时,可以通过红光的照明部分地擦除这种持续增加。这些照片响应是通过简单的带弯曲模型来解释,其中AlGaN势垒中的深度水平通过UV光产生正电荷,从而导致在AlGaN层中弯曲的抛物线带弯曲,而这些深度水平的一些药水被中和红灯。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号