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Performance Analysis of Modified Drain Gating Techniques for Low Power and High Speed Arithmetic Circuits

机译:低功耗高速算术电路的改进的漏极门控技术性能分析

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摘要

This paper presents several high performance and low power techniques for CMOS circuits. In these design methodologies, drain gating technique and its variations are modified by adding an additional NMOS sleep transistor at the output node which helps in faster discharge and thereby providing higher speed. In order to achieve high performance, the proposed design techniques trade power for performance in the delay critical sections of the circuit. Intensive simulations are performed using Cadence Virtuoso in a 45 nm standard CMOS technology at room temperature with supply voltage of 1.2 V. Comparative analysis of the present circuits with standard CMOS circuits shows smaller propagation delay and lesser power consumption.
机译:本文介绍了几种用于CMOS电路的高性能和低功耗技术。在这些设计方法中,通过在输出节点处添加一个额外的NMOS睡眠晶体管来修改漏极门控技术及其变化,这有助于更快地放电,从而提供更高的速度。为了获得高性能,提出的设计技术在电路的延迟关键部分中权衡了性能。使用Cadence Virtuoso在45 nm标准CMOS技术中于室温下以1.2 V的电源电压进行密集仿真。对本电路与标准CMOS电路的比较分析显示,传播延迟较小,功耗较小。

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