Alldwance for the Background Component in X-ray Photoelectron and Auger Electron Spectroscopy

M. V. Zakhvatova; F. Z. Gilmutdinov; D. V. Surnin

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Alldwance for the Background Component in X-ray Photoelectron and Auger Electron Spectroscopy

机译：X射线光电子和俄歇电子能谱中本底成分的Alldwance

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摘要

A simple and efficient method of subtraction of the nonlinear background in X-ray diffraction and Auger electron spectroscopy is suggested. The method has been verified using test samples of Fe-Ni alloys and oxides of transition metals of a known composition.

机译：提出了一种简单有效的方法，在X射线衍射和俄歇电子能谱学中减去非线性背景。该方法已使用已知成分的Fe-Ni合金和过渡金属氧化物的测试样品进行了验证。

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《The Physics of Metals and Metallography》 |2007年第2期|共6页
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M. V. Zakhvatova; F. Z. Gilmutdinov; D. V. Surnin;
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正文语种 eng
中图分类金属学与热处理;
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1. Alldwance for the Background Component in X-ray Photoelectron and Auger Electron Spectroscopy [J] . M. V. Zakhvatova, F. Z. Gilmutdinov, D. V. Surnin The Physics of Metals and Metallography . 2007,第2期

机译：X射线光电子和俄歇电子能谱中本底成分的Alldwance
2. Electronic structure studies of Ni_X (X: B, S, P) alloys using x-ray photoelectron spectroscopy, x-ray induced Auger electron spectroscopy and density functional theory calculations [J] . S Diplas, O M L_vvik Journal of Physics. Condensed Matter . 2009,第24期

机译：Ni_X（X：B，S，P）合金的电子结构研究，使用的是X射线光电子能谱，X射线感应俄歇电子能谱和密度泛函理论计算
3. Site-specific ion desorption from condensed F_3SiCD_2CH_2Si(CH_3)_3 induced by Si-2p core-level ionizations studied with photoelectron photoion coincidence (PEPICO) spectroscopy, Auger photoelectron coincidence spectroscopy (APECS) and Auger electron photoion coincidence (AEPICO) spectroscopy [J] . Kazuhiko Mase, Eiichi Kobayashi, Akira Nambu, Surface Science . 2013,第JANa期

机译：Si-2p核心能级电离引起的凝聚F_3SiCD_2CH_2Si（CH_3）_3的位点特定离子解吸，通过光电子重合能谱（PEPICO），俄歇光电子重合能谱（APECS）和俄歇光电子重合能谱（AEPICO）研究
4. Some Issues in Quantitative X-Ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy [C] . C. J. Powell, J. M. Conny, A. Jablonski International Symposium on State-of-the-Art Application of Surface and Interface Analysis Methods to Environmental Material Interactions: in Honor of James E.Castle's 65th Year, Mar 26-27, 2001, Washington D.C. . 2001

机译：定量X射线光电子能谱和俄歇电子能谱中的一些问题
5. Characterization of the electronic and geometric structures of aluminas using X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, and low energy electron diffraction. [D] . Kao, Chi-Chang. 1988

机译：使用X射线光电子能谱，俄歇电子能谱，电子能量损失能谱和低能电子衍射来表征氧化铝的电子和几何结构。
6. Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy [O] . A. Jablonski, C. J. Powell -1

机译：通过俄歇电子能谱和X射线光电子能谱定量测定表面成分的有效衰减长度
7. Comment on "Quantitative x-ray photoelectron spectroscopy: Quadrupole effects, shake up, Shirley background, and relative sensitivity factors from a database of true x-ray photoelectron spectra" [O] . Trzhaskovskaya, M. B., Nikulin, V. K. 2007

机译：评论“定量X射线光电子能谱：四极杆影响，震动，雪莉背景和相对敏感因素真实的X射线光电子能谱数据库“
8. Examination of FeS sub 2 and Related Compounds by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy [R] . Madden, H. H. , Guidotti, R. A. , Nebesny, K. W. 1987

机译：用X射线光电子能谱和俄歇电子能谱检测Fes sub 2及相关化合物

Alldwance for the Background Component in X-ray Photoelectron and Auger Electron Spectroscopy

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