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Photoluminescence dynamics due to exciton and free carrier transport in GaAs/AlAs superlattices

机译:GaAs / AlAs超晶格中由于激子和自由载流子传输引起的光致发光动力学

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Photogenerated carrier transfer is investigated in a set of three GaAs/AlAs short-period superlattices (SPSs) with different barrier thicknesses by steady-state and time-resolved photoluminescence (PL) spectroscopy at 1520 K as a function of excitation power. The tunneling transport of carriers is evaluated by detecting excitonic PL signals from an embedded GaAs single quantum well (SQW) in the middle of the SPS layer. We find that, as the barrier thickness is decreased, the PL intensity ratio of SQW/SPS increases systematically due to enhanced tunneling efficiencies of both electrons and holes. However, the PL intensity ratio significantly increases with decreases in the excitation power by more than two orders of the magnitude. We attribute the enhanced PL intensity of SQW relative to the SPS to the faster transport of electrons that can recombine with residual holes to form excitons in SQW. The PL dynamics of SQW and SPS thus shows unique density-dependent PL intensity and time behaviors due to variations in relative amounts of excitons and free carriers to be transported into the SQW layer.
机译:通过在1520 K下的稳态和时间分辨光致发光(PL)光谱,研究了在三个具有不同势垒厚度的GaAs / AlAs短周期超晶格(SPS)中作为激发功率的函数的光生载流子转移。通过检测来自SPS层中间的嵌入式GaAs单量子阱(SQW)的激子PL信号来评估载流子的隧穿传输。我们发现,随着势垒厚度的减小,由于电子和空穴的隧穿效率提高,SQW / SPS的PL强度比会系统地增加。然而,PL强度比随着激励功率的减小而显着增加,幅度超过两个数量级。我们将SQW相对于SPS的PL强度增强归因于可以与残留空穴复合以在SQW中形成激子的电子的更快传输。由于激子和自由载流子相对量的变化,SQW和SPS的PL动力学表现出独特的密度依赖性PL强度和时间行为,该自由量将被传输到SQW层中。

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