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Critical paths in circuits with level-sensitive latches

机译:具有电平敏感锁存器的电路中的关键路径

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This paper extends the classical notion of critical paths inncombinational circuits to the case of synchronous circuits that usenlevel-sensitive latches. Critical paths in such circuits arise fromnsetup, hold, and cyclic constraints on the data signals at the inputs ofneach latch and may extend through one or more latches. Two approachesnare presented for identifying these critical paths and verifying theirntiming. The first implicitly checks all paths using a relaxation-basednsolution procedure. Results of this procedure are used to calculatenslack values, which in turn identify satisfied and violated criticalnpaths. The second approach is based on a constructive algorithm whichngenerates all the critical paths in a circuit and then verifies thatntheir timing constraints are satisfied. Algorithms are evaluated andncompared using circuits from the ISCAS89 sequential benchmark suite andnthe Michigan High Performance Microprocessor Project
机译:本文将组合电路中关键路径的经典概念扩展到使用电平敏感锁存器的同步电路的情况。这种电路中的关键路径是由每个锁存器的输入处的数据信号的建立,保持和循环约束引起的,并且可能延伸通过一个或多个锁存器。提出了两种方法来识别这些关键路径并验证其正确性。第一个使用基于松弛的求解过程隐式检查所有路径。该过程的结果用于计算nslack值,从而确定满意和违反的临界路径。第二种方法基于一种构造算法,该算法对电路中的所有关键路径进行激励,然后验证其时序约束是否得到满足。使用ISCAS89顺序基准套件和密歇根州高性能微处理器项目的电路对算法进行评估和比较。

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