首页> 外国专利> By=pass sampling path for integrated circuit contg. complex logic - has control and observation points, and selector data transfer path contg. or by=passing shift register with series latches

By=pass sampling path for integrated circuit contg. complex logic - has control and observation points, and selector data transfer path contg. or by=passing shift register with series latches

机译:旁路=集成电路连续的采样路径。复杂逻辑-具有控制点和观察点,以及选择器数据传输路径(续)。或通过串联锁存器传递移位寄存器

摘要

The bypass sampling path in an integrated circuit contains at least one control point and one observation point for transferring and outputting observation point data. Data for selected a data transfer path and control point data are entered via a single data entry connection (201). The control point and observation point data are shifted and held by shift register (10) series latches between the data entry (201) and output (204) connections. A sampling path selector (20a) selects a data path either contg. or bypassing the shift path according to the entered selection data. USE/ADVANTAGE - For boundary scan tests in accordance with IEEE 1149.1. Reduced testing time and number of test pins.
机译:集成电路中的旁路采样路径包括至少一个控制点和一个观察点,用于传输和输出观察点数据。通过单个数据输入连接(201)输入用于选择数据传输路径的数据和控制点数据。通过数据输入(201)和输出(204)连接之间的移位寄存器(10)系列锁存器对控制点和观察点数据进行移位和保持。采样路径选择器(20a)选择一个连续的数据路径。或根据输入的选择数据绕过换档路径。使用/优势-用于符合IEEE 1149.1的边界扫描测试。减少了测试时间并减少了测试针的数量。

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