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Critical paths in circuits with level-sensitive latches

机译:具有电平敏感锁存器的电路中的关键路径

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This paper extends the classical notion of critical paths in combinational circuits to the case of synchronous circuits that use level-sensitive latches. Critical paths in such circuits arise from setup, hold, and cyclic constraints on the data signals at the inputs of each latch and may extend through one or more latches. Two approaches are presented for identifying these critical paths and verifying their timing. The first implicitly checks all paths using a relaxation-based solution procedure. Results of this procedure are used to calculate slack values, which in turn identify satisfied and violated critical paths. The second approach is based on a constructive algorithm which generates all the critical paths in a circuit and then verifies that their timing constraints are satisfied. Algorithms are evaluated and compared using circuits from the ISCAS89 sequential benchmark suite and the Michigan High Performance Microprocessor Project.
机译:本文将组合电路中关键路径的经典概念扩展到使用电平敏感锁存器的同步电路的情况。这种电路中的关键路径来自对每个锁存器输入处的数据信号的建立,保持和循环约束,并且可能会延伸通过一个或多个锁存器。提出了两种方法来识别这些关键路径并验证其时序。第一个使用基于松弛的求解过程隐式检查所有路径。此过程的结果用于计算松弛值,从而确定满意和违反的关键路径。第二种方法基于构造算法,该算法在电路中生成所有关键路径,然后验证其时序约束是否得到满足。使用ISCAS89顺序基准套件和密歇根州高性能微处理器项目的电路对算法进行评估和比较。

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