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Effects of inductance on the propagation delay and repeater insertion in VLSI circuits

机译:电感对VLSI电路中传播延迟和中继器插入的影响

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A closed-form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range of RLC loads. It is shown that the error in the propagation delay if inductance is neglected and the interconnect is treated as a distributed RC line can be over 35% for current on-chip interconnect. It is also shown that the traditional quadratic dependence of the propagation delay on the length of the interconnect for RC lines approaches a linear dependence as inductance effects increase. On-chip inductance is therefore expected to have a profound effect on traditional high-performance integrated circuit (IC) design methodologies. The closed-form delay model is applied to the problem of repeater insertion in RLC interconnect. Closed-form solutions are presented for inserting repeaters into RLC lines that are highly accurate with respect to numerical solutions. RC models can create errors of up to 30% in the total propagation delay of a repeater system as compared to the optimal delay if inductance is considered. The error between the RC and RLC models increases as the gate parasitic impedances decrease with technology scaling. Thus, the importance of inductance in high-performance very large scale integration (VLSI) design methodologies will increase as technologies scale.
机译:引入了用于驱动分布式RLC线的CMOS门的传播延迟的闭式表达式,该表达式在宽范围的RLC负载的动态电路仿真的5%之内。结果表明,对于片上电流互连,如果忽略电感并且将互连视为分布式RC线路,则传播延迟的误差可能超过35%。还显示出,随着电感效应的增加,传统的传播延迟对RC线互连长度的二次依赖性接近线性依赖性。因此,片上电感有望对传统的高性能集成电路(IC)设计方法产生深远的影响。封闭形式的延迟模型适用于RLC互连中的中继器插入问题。提出了封闭形式的解决方案,用于将中继器插入相对于数值解决方案高度精确的RLC线。与考虑电感时的最佳延迟相比,RC模型可在中继器系统的总传播延迟中产生高达30%的误差。 RC和RLC模型之间的误差随着栅极寄生阻抗随技术规模的减小而增加。因此,随着技术规模的扩大,电感在高性能超大规模集成电路(VLSI)设计方法中的重要性将日益提高。

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