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Block-based multiperiod dynamic memory design for low data-retention power

机译:基于块的多周期动态存储器设计,可降低数据保留能力

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Dynamic random access memorys (DRAMs) are widely used in portable applications due to their high storage density. In standby mode, the main source of DRAM power dissipation is the refresh operation that periodically restores leaking charge in each memory cell to its correct level. Conventional DRAMs use a single refresh period determined by the cell with the largest leakage. This approach is simple but dissipative, because it forces unnecessary refreshes for the majority of the cells with small leakage. In this paper, we investigate a novel scheme that relies on small refresh blocks and multiple refresh periods to reduce DRAM dissipation by decreasing the number of cells refreshed too often. In contrast to conventional row-based refresh, small refresh blocks are used to increase worst case data retention times. Long periods are used to accommodate cells with small leakage. Retention times are further extended by adding a swap cell to each refresh block. We give a novel polynomial-time algorithm for computing an optimal set of refresh periods for block-based multiperiod refresh. Specifically, given an integer K and a distribution of data-retention times, in O(KN2) steps our algorithm computes K refresh periods that minimize DRAM dissipation, where N is the number of refresh blocks in the memory. We describe and evaluate a scalable implementation of our refresh scheme whose overhead is asymptotically linear with memory size. In simulations with a 16-Mb DRAM, block-based multiperiod refresh reduces DRAM standby dissipation by a multiplicative factor of 4 with area overhead below 6%. Moreover, our proposed scheme is robust to semiconductor process variations, with power savings degrading no more than 7% over a 20-fold increase of leaky cells.
机译:动态随机存取存储器(DRAM)由于其高存储密度而被广泛用于便携式应用中。在待机模式下,DRAM功耗的主要来源是刷新操作,该操作可定期将每个存储单元中的泄漏电荷恢复到正确的水平。常规DRAM使用由泄漏量最大的单元确定的单个刷新周期。该方法简单但耗散,因为它对大多数具有较小泄漏的电池强制进行不必要的刷新。在本文中,我们研究了一种新颖的方案,该方案依赖于小的刷新块和多个刷新周期,以通过减少过于频繁刷新的单元数来减少DRAM的耗散。与常规的基于行的刷新相比,较小的刷新块用于增加最坏情况下的数据保留时间。长时间用于容纳泄漏量较小的电池。通过向每个刷新块添加交换单元,可以进一步延长保留时间。我们给出了一种新颖的多项式时间算法,用于计算基于块的多周期刷新的最佳刷新周期集。具体来说,给定一个整数K和一个数据保留时间分布,在O(KN2)个步骤中,我们的算法将计算K个刷新周期,以最大程度地减少DRAM的耗散,其中N是内存中刷新块的数量。我们描述并评估了刷新方案的可扩展实现,该方案的开销与内存大小渐近线性。在具有16 Mb DRAM的仿真中,基于块的多周期刷新将DRAM待机功耗降低了4倍,而面积开销却低于6%。此外,我们提出的方案对半导体工艺变化具有鲁棒性,在泄漏电池增加20倍的情况下,功率节省的幅度不超过7%。

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