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Modeling subthreshold SOI logic for static timing analysis

机译:为静态时序分析建模亚阈值SOI逻辑

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摘要

A simple, yet realistic physics-based model is introduced to describe the subthreshold drain current of a MOSFET taking into account the body- and drain-voltage dependencies, including the short channel effects. This model, verified by SPICE simulations, describes adequately the pseudotriode and pseudosaturation regions of MOS transistors operated below VT. It can be applied for predicting bulk- or partially depleted (PD) SOI CMOS circuit operation. Analytical expressions derived for the logic switching threshold and delay are applied to predict the performance of CMOS-SOI inverters.
机译:引入了一个简单而又切合实际的基于物理的模型,该模型描述了MOSFET的亚阈值漏极电流,其中考虑了体电压和漏极电压的依赖性,包括短沟道效应。通过SPICE仿真验证的该模型充分描述了在VT以下工作的MOS晶体管的伪三极管和伪饱和区。它可用于预测体耗尽(PD)SOI CMOS电路操作。为逻辑开关阈值和延迟导出的解析表达式可用于预测CMOS-SOI反相器的性能。

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