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A Low-Power Low-Cost On-Chip Digital Background Calibration for Pipelined ADCs

机译:用于流水线ADC的低功耗低成本片上数字背景校准

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This paper proposes a low-power low-cost on-chip digital background calibration for a pipelined ADC. This new redundant-stage calibration algorithm reduces the effect of quantization noise and can be applied for multiple stages; hence, it improves the calibration accuracy and is easily implemented fully on-chip with low power and low hardware cost. We realize the proposed calibration technique in a prototype 12-bit 250-MS/s pipelined ADC fabricated in a 55-nm technology. The measured results show that the prototype ADC, with an active area of 1310 mu m x 510 mu m, achieves an signal-to-noise-and-distortion ratio of 66.7 dB [effective number of bits (ENOB) = 10.8 bit] and consumes a total power of 85 mW with a sampling rate of 250 MS/s after applying our digital calibration, where the on-chip digital calibration circuit consumes only 5 mW and an active area of 360 mu m x 510 mu m.
机译:本文提出了流水线ADC的低功耗,低成本片上数字背景校准。这种新的冗余级校准算法减少了量化噪声的影响,可应用于多个级。因此,它提高了校准精度,并易于以低功耗和低硬件成本在片上实现。我们在采用55 nm技术制造的原型12位250-MS / s流水线ADC中实现了建议的校准技术。测量结果表明,原型ADC的有效面积为1310μmx510μm,实现了66.7 dB的信噪比和失真比[有效位数(ENOB)= 10.8位]并消耗了应用我们的数字校准后,总功率为85 mW,采样率为250 MS / s,其中片上数字校准电路仅消耗5 mW,有效面积为360μmx510μm。

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