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Influence of Zn~(2+) doping on the crystal structure and optical-electrical properties of CdTe thin films

机译:Zn〜(2+)掺杂对CdTe薄膜晶体结构和光电性能的影响

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The present study reports the synthesis of Cd_(1-x)Zn_xTe (x= 0,0.025,0.050,0.075 and 0.100) nanocrystalline thin film through a simple two step method. In the first step fine nanopar-ticles of Cd_(1-x)Zn_xTe was prepared by solvothermal microwave irradiation (SMI) technique and then deposited as thin film using dip-coating technique. X-ray diffraction study showed that films are polycrystalline with cubic phase, which are preferentially oriented along the (111) direction. No impurity phase was observed in the XRD pattern even after higher concentration of doping (x = 0.100) of Zn. FESEM study revealed that the films are homogeneous without cracks and pinholes. TEM micrographs revealed the particles are slightly agglomerated and lesser than 25 nm. The optical absorption study revealed that pure and doped CdTe films possess a direct band gap material with bandgap values between 2.39 and 2.63 eV (±0.02 eV). The values of optical bandgap increase with an increase in dopant (Zn) concentration from x = 0.025 to 0.10. The pure cadmium telluride (CdTe) nanocrystalline film shows a strong green emission peak centered at about 525 nm. The emission peaks of Cd_(1-x)Zn_xTe nanocrystalline films are red shifted from 525 nm to 611 nm according to the dopant (Zn~(2+)) concentration. The grains in the prepared films are uniformly distributed, which was confirmed by narrow full width at half maximum (FWHM) of the emission peaks (40-65 nm). The DC conductivity has increased by 1.25 and 4 orders as the concentration of dopant increases from x = 0.025 to 0.10 at room temperature (30 ℃) and 150 ℃ respectively. The higher conductivity value is underpinned by the smaller activation energy value and is explained by thermionic emission mechanism.
机译:本研究报道了通过简单的两步法合成Cd_(1-x)Zn_xTe(x = 0,0.025,0.050,0.075和0.100)纳米晶体薄膜的过程。第一步,通过溶剂热微波辐射(SMI)技术制备Cd_(1-x)Zn_xTe纳米微粒,然后使用浸涂技术将其沉积为薄膜。 X射线衍射研究表明,薄膜是立方相的多晶,优先沿(111)方向取向。即使在较高浓度的Zn掺杂(x = 0.100)之后,也没有在XRD图中观察到杂质相。 FESEM研究表明,薄膜是均匀的,没有裂纹和针孔。 TEM显微照片显示颗粒略微团聚,小于25 nm。光吸收研究表明,纯净和掺杂的CdTe薄膜具有带隙介于2.39和2.63 eV(±0.02 eV)之间的直接带隙材料。光学带隙的值随着掺杂剂(Zn)浓度从x = 0.025到0.10的增加而增加。纯碲化镉(CdTe)纳米晶体薄膜在525 nm处显示出很强的绿色发射峰。 Cd_(1-x)Zn_xTe纳米晶体薄膜的发射峰根据掺杂剂(Zn〜(2+))的浓度从525 nm红移到611 nm。制备的薄膜中的晶粒均匀分布,这可以通过发射峰(40-65 nm)的半峰全宽窄(FWHM)来确认。在室温(30℃)和150℃下,随着掺杂剂浓度从x = 0.025增加到0.10,直流电导率分别增加了1.25和4个数量级。较高的电导率值由较小的活化能值来支撑,并由热电子发射机理解释。

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