Automated system for the characterization of high resistivity semiconductors by the van der Pauw method

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Automated system for the characterization of high resistivity semiconductors by the van der Pauw method

机译：用范德堡方法表征高电阻率半导体的自动化系统

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An automated system for dark conductivity and Hall measurements and photoconductivity and photo‐Hall characterization of high resistivity semiconductors is described. This system has been applied to commercially available semi‐insulating GaAs substrates.

机译：描述了用于暗电导率和霍尔测量以及高电阻率半导体的光电导和光电霍尔特性的自动化系统。该系统已应用于市售的半绝缘GaAs衬底。

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《Review of Scientific Instruments》 |1981年第7期|P.1047-1050|共4页
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1. Direct comparison of time-resolved terahertz spectroscopy and Hall Van der Pauw methods for measurement of carrier conductivity and mobility in bulk semiconductors [J] . Alberding Brian G., Thurber W. Robert, Heilweil Edwin J. Journal of the Optical Society of America, B. Optical Physics . 2017,第7期

机译：直接比较时间分辨的太赫兹光谱和Hall Van der PauW方法，用于测量散装半导体中的载波电导率和移动性
2. Neurocomputing van der Pauw function for the measurement of a semiconductor’s resistivity without use of the learning rate of weight vector regulation [J] . Li Hongli, Sun Yicai, Wang Wei, Journal of Semiconductors . 2011,第12期

机译：神经计算范德鲍函数，无需使用权重向量调节的学习率即可测量半导体的电阻率
3. Charge carrier mobility in thin films of organic semiconductors by the gated van der Pauw method [J] . Cedric Rolin, Enpu Kang, Jeong-Hwan Lee, Nature Communications . 2017,第1期

机译：通过门控范德堡方法在有机半导体薄膜中的载流子迁移率
4. On the measurement of high resistance semiconductors by the van der Pauw method [C] . Morvic, M. . 2000

机译：用范德堡法测量高阻半导体
5. Beyond van der Pauw: Novel methods for four-point magnetotransport characterization. [D] . Zhou, Wang. 2016

机译：超越范德堡：四点磁传输表征的新方法。
6. Direct comparison of time-resolved Terahertz spectroscopy and Hall Van der Pauw methods for measurement of carrier conductivity and mobility in bulk semiconductors [O] . Brian G. Alberding, W. Robert Thurber, Edwin J. Heilweil -1

机译：时间分辨太赫兹光谱法和Hall Van der Pauw方法的直接比较用于测量体半导体中的载流子电导率和迁移率
7. Direct comparison of time-resolved terahertz spectroscopy and Hall Van der Pauw methods for measurement of carrier conductivity and mobility in bulk semiconductors [O] . Brian G. Alberding, W. Robert Thurber, Edwin J. Heilweil 2017

机译：直接比较时间分辨的太赫兹光谱和展示船舶导电性和散装半导体流动性的方法
8. Measurement of High Resistivity Semiconductors using the van der Pauw Method. [R] . Hemenger, P. M. 1972

机译：使用van der pauw方法测量高电阻率半导体。

Automated system for the characterization of high resistivity semiconductors by the van der Pauw method

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