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首页> 外文期刊>Physica Status Solidi. C, Conferences and critical reviews >RF-MBE growth of cubic InN films on MgO (001) substrates
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RF-MBE growth of cubic InN films on MgO (001) substrates

机译:MgO(001)衬底上立方InN膜的RF-MBE生长

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Cubic InN films have been grown on MgO substrates with cubic GaN underlayers by RF-N_2 plasma MBE. By changing the growth conditions, we clarified the growth temperature and In flux dependence of the quality of cubic InN films. It was found the surface of cubic InN films grown at relatively higher temperatures was smooth and that the hexagonal phase content in the InN films decreased with increasing In flux. Based on the findings, we have successfully obtained a c-InN film with high phase-purity and a smooth surface. We have carried out micro Raman scattering measurements for the high-quality cubic InN film. Raman peaks were clearly observed at 596 cm~(-1) and 467 cm~(-1), which are attributed to longitudinal optical and transverse optical phonon modes of cubic InN, respectively.
机译:通过RF-N_2等离子体MBE,在具有立方GaN底层的MgO衬底上生长了立方InN膜。通过改变生长条件,我们阐明了立方InN薄膜质量的生长温度和In In流量依赖性。发现在相对较高的温度下生长的立方InN膜的表面是光滑的,并且InN膜中的六方相含量随着In通量的增加而降低。基于这些发现,我们成功地获得了具有高相纯度和光滑表面的c-InN薄膜。我们已经对高质量立方InN薄膜进行了微拉曼散射测量。在596 cm〜(-1)和467 cm〜(-1)处清晰地观察到拉曼峰,这分别归因于立方InN的纵向光学和横向光学声子模。

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