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Design and optimization of adaptable BCH codecs for NAND flash memories

机译:适用于NAND闪存的BCH编解码器的设计和优化

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摘要

NAND flash memories represent a key storage technology for solid-state storage systems. However, they suffer from serious reliability and endurance issues that must be mitigated by the use of proper error correction codes. This paper proposes the design and implementation of an optimized Bose-Chaudhuri-Hocquenghem hardware codec core able to adapt its correction capability in a range of predefined values. Code adaptability makes it possible to efficiently trade-off, in-field reliability and code complexity. This feature is very important considering that the reliability of a NAND flash memory continuously decreases over time, meaning that the required correction capability is not fixed during the life of the device. Experimental results show that the proposed architecture enables to save resources when the device is in the early stages of its lifecycle, while introducing a limited overhead in terms of area.
机译:NAND闪存代表了固态存储系统的一项关键存储技术。然而,它们遭受严重的可靠性和耐久性问题,必须通过使用适当的纠错码来缓解这些问题。本文提出了一种优化的Bose-Chaudhuri-Hocquenghem硬件编解码器内核的设计和实现,该内核可以在预定值范围内适应其校正能力。代码适应性使高效折衷,现场可靠性和代码复杂性成为可能。考虑到NAND闪存的可靠性会随着时间的推移而持续下降,因此该功能非常重要,这意味着所需的校正能力在设备的使用寿命中并未固定。实验结果表明,所提出的体系结构能够在设备处于生命周期的早期阶段节省资源,同时在面积方面引入了有限的开销。

著录项

  • 来源
    《Microprocessors and microsystems》 |2013年第5期|407-419|共13页
  • 作者单位

    Department of Control and Computer Engineering, Politecnko di Torino, Corso Duca degli Abruzzi 24,1-10129 Torino, Italy;

    Department of Control and Computer Engineering, Politecnko di Torino, Corso Duca degli Abruzzi 24,1-10129 Torino, Italy;

    Department of Control and Computer Engineering, Politecnko di Torino, Corso Duca degli Abruzzi 24,1-10129 Torino, Italy;

    Department of Control and Computer Engineering, Politecnko di Torino, Corso Duca degli Abruzzi 24,1-10129 Torino, Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Flash memories; Error correcting codes; Memory testing; BCH codes;

    机译:闪存;纠错码;内存测试;BCH代码;

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