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SRAM devices and circuits optimization toward energy efficiency in multi-V_(th) CMOS

机译:SRAM器件和电路针对多V_(CMOS)的能源效率进行了优化

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摘要

Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mobile electronics, wireless sensor nodes, implantable biomedical devices, etc. Due to high computing capability requirements in such applications, SRAMs play a critical role in energy consumption. This paper presents SRAM energy analysis utilizing multi-threshold (multi-V_(th)) voltage devices and various circuit techniques for power reduction and performance improvement, and suggests optimal device combinations for energy efficiency improvement. In general, higher-V_(th) devices are preferred in the cross-coupled latches and the write access transistors for reducing leakage current while lower-V_(th) devices are desired in the read port for implementing higher performance. However, excessively raised V_(th) in the write paths, i.e. the cross-coupled latches and the write access transistors, leads to slower write speed than read, quickly nullifying improved energy efficiency. In this work, the energy efficiency improvement of 6.24 × is achieved only through an optimal device combination in a commercial 65 nm CMOS technology. Employing power reduction and performance boosting techniques together with the optimal device combination enhances the energy efficiency further up to 33 × .
机译:在许多新兴应用中,例如移动电子设备,无线传感器节点,可植入生物医学设备等,都非常需要最小能量驱动的电路设计。由于在此类应用中对计算能力的要求很高,SRAM在能耗中起着至关重要的作用。本文介绍了利用多阈值(multi-V_(th))电压器件和各种电路技术降低功率和提高性能的SRAM能量分析,并提出了用于提高能效的最佳器件组合。通常,在交叉耦合的锁存器和写访问晶体管中优选较高V_(th)的器件以减小泄漏电流,而在读取端口中期望较低V_(th)的器件以实现更高的性能。但是,写入路径中的V_(th),即交叉耦合的锁存器和写入访问晶体管的V_(th)过度升高,导致写入速度比读取速度慢,从而迅速使提高的能量效率无效。在这项工作中,只有在商用65 nm CMOS技术中通过最佳的器件组合才能实现6.24×的能效提高。采用功耗降低和性能提升技术以及最佳的设备组合,可进一步提高能源效率,最高可达33×。

著录项

  • 来源
    《Microelectronics journal》 |2015年第3期|265-272|共8页
  • 作者单位

    School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore,Institute of Microelectronics, Agency for Science, Technology and Research, 11 Science Park Road, Singapore 117685, Singapore;

    Institute of Microelectronics, Agency for Science, Technology and Research, 11 Science Park Road, Singapore 117685, Singapore;

    School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CMOS memory circuits; SRAM; Energy minimization; Multi-V_(th); Leakage reduction; Power reduction;

    机译:CMOS存储电路;SRAM;能量最小化;多V_(th);减少泄漏;降低功率;

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