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High mobility SiGe heterostructures fabricated by low-energy plasma-enhanced chemical vapor deposition

机译:通过低能等离子体增强化学气相沉积法制备的高迁移率SiGe异质结构

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We present results obtained on modulation-doped quantum wells with compressively strained Ge channels. The heterostructures have been grown by low-energy plasma-enhanced chemical vapor deposition (LEPECVD). Magneto-transport measurements were carried out both on van der Pauw squares and lithographically defined Hall bars. The 2 K hole mobility increases with sheet density, and exceeds 10~5 cm~2V~(-1) s~(-1) below 40 K for carrier densities above 8 x 10~(11) cm~(-2). It is dominated by remote impurity scattering, according to linear transport theory calculations. The same conclusion follows from the Dingle ratios of 5-10 derived from the low-field longitudinal magnetoresistance. Room-temperature channel mobilities were extracted from the magnetic field dependence of longitudinal and transverse magnetoresistance by means of mobility spectrum analysis. We obtained 2940 cm~2V~(-1)s~(-1) at a sheet hole density of 5.7x10~(11) cm~(-2).
机译:我们目前在具有压缩应变Ge通道的调制掺杂量子阱上获得的结果。异质结构已通过低能等离子体增强化学气相沉积(LEPECVD)生长。磁性传输测量在van der Pauw正方形和光刻定义的Hall条上进行。 2 K空穴迁移率随薄片密度的增加而增加,对于载流子密度大于8 x 10〜(11)cm〜(-2)的情况,在40 K以下时超过10〜5 cm〜2V〜(-1)s〜(-1)。根据线性传输理论计算,它主要受远程杂质散射的影响。根据低场纵向磁阻得出的5-10的Dingle比得出相同的结论。通过迁移谱分析从纵向和横向磁阻的磁场依赖性中提取室温通道迁移率。我们在5.7x10〜(11)cm〜(-2)的孔密度下获得了2940 cm〜2V〜(-1)s〜(-1)。

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