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首页> 外文期刊>Journal of Microelectromechanical Systems >Practical CMUT Fabrication With a Nitride-to-Oxide-Based Wafer Bonding Process
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Practical CMUT Fabrication With a Nitride-to-Oxide-Based Wafer Bonding Process

机译:基于氮化物至氧化物的晶圆键合工艺的实用CMUT制造

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摘要

The introduction of wafer-bonding technique to capacitive micromachined ultrasonic transducer (CMUT) fabrication offered advantages over the surface micromachining technique, such as simplified fabrication, better membrane uniformity, and increased active area. The conventional wafer-bonding CMUT process employs silicon-on-insulator (SOI) wafers to produce the vibrating membrane layer. However, the use of SOI wafers can lead to poor membrane thickness uniformity despite the high cost. Furthermore, an additional local-oxidation (LOCOS) process should be used for SOI-based wafer bonding process to improve breakdown voltage and reduce parasitic capacitance. This paper reports a nitride-to-oxide bonding process for CMUT fabrication, designed to achieve similar results as the LOCOS-added process reported by Park et al., but without the need for SOIs and fabrication complexity. A fully functional CMUT designed for collapse-mode operation was fabricated and an immersion center frequency was measured to be 4.2 MHz with a 90% bandwidth. [2016-0210]
机译:晶圆键合技术在电容性微机械超声换能器(CMUT)制造中的引入提供了优于表面微加工技术的优势,例如简化了制造工艺,改善了膜的均匀性并增加了有效面积。常规的晶圆键合CMUT工艺采用绝缘体上硅(SOI)晶圆来生产振动膜层。然而,尽管成本高昂,但使用SOI晶圆仍会导致膜厚均匀性差。此外,对于基于SOI的晶圆键合工艺,应使用额外的局部氧化(LOCOS)工艺,以提高击穿电压并减小寄生电容。本文报道了用于CMUT制造的氮化物-氧化物键合工艺,旨在获得与Park等人报道的添加LOCOS的工艺相似的结果,但无需SOI和制造复杂性。制造了专为崩溃模式操作设计的功能齐全的CMUT,测得的浸入中心频率为4.2 MHz,带宽为90%。 [2016-0210]

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