Step and flash imprint lithography template characterization, from an etch perspective

摘要

As a means of studying process windows with short turnaround time while avoiding substrate-to-substrate repeatability issues, Step and Flash Imprint Lithography templates were fabricated with physical masking of quadrants during dry etching used to introduce process perturbations. For every 20 s of descum (Ar/O_2 etch) time, critical dimensions (CD) were observed to change approximately 2.6 nm on sub-100 nm features. Similarly, increasing Cr overetch time by 20% resulted in a positive CD change of 3.8 nm. Line edge roughness decreased with increasing descum and Cr overetch times. Best overall performance was observed for a 20 s descum used in conjunction with a 110% Cr overetch. Of four tip types studied, sharpened silicon atomic force microscopy tips were able to accurately measure etch depth of 80 nm trenches, but geometrical considerations limited sidewall angle determination to greater than 100°. Cross-sectioning of features on 6 x 6 x 0.25 in. quartz plates was successfully accomplished using a focused ion beam technique with typical sidewall angles of about 95° observed on 150 nm features. Finally, minimal microloading was observed for the ICP-based quartz etch process. Feature sizes ranging from 70 nm up to 8 μm possessed an average etch depth of 88.8 nm with a 1.2 nm (1 sigma) variation.