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The latency insertion method for simulations of phase-locked loops

机译:用于锁相环仿真的等待时间插入方法

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In this paper, we present two methods for the simulations of phase-locked loops (PLL) based on the latency insertion method (LIM). First, we present a novel and simple behavioral model based simulation method that exploits the latency in the PLL formulation and utilizes a leapfrog time stepping discretization scheme to solve for the transient response of the PLL. Next, we apply LIM to the simulation of PLLs at the transistor level. Various PLL dynamic responses such as lock-in, pull-in and pull-out conditions are simulated and comparisons with analytical solutions are depicted when available. Results are also compared to traditional SPICE-based methods. Finally, a bottom-up behavioral simulation approach is illustrated by using LIM to generate individual models for the PLL components which are then used in an overall behavioral level simulation.
机译:在本文中,我们提出了两种基于等待时间插入方法(LIM)的锁相环(PLL)仿真方法。首先,我们提出了一种新颖且简单的基于行为模型的仿真方法,该方法利用了PLL公式中的等待时间,并采用了跨步时间步离散化方案来解决PLL的瞬态响应。接下来,我们将LIM应用于晶体管级的PLL仿真。模拟了各种PLL动态响应,例如锁定,拉入和拉出条件,并在可用时描述了与分析解决方案的比较。还将结果与传统的基于SPICE的方法进行比较。最后,通过使用LIM为PLL组件生成单独的模型来说明自底向上的行为仿真方法,然后将其用于整体行为级别仿真。

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