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首页> 外文期刊>Journal of Computational Electronics >Analog performance investigation of dual electrode based doping-less tunnel FET
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Analog performance investigation of dual electrode based doping-less tunnel FET

机译:基于双电极的无掺杂隧道FET的模拟性能研究

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摘要

In this paper, we have proposed a device and named it dual electrode doping-less TFET (DEDLTFET), in which electrodes on top and bottom of source and drain are considered to enhance the ON state current and Analog performances. The charge plasma technique is used to generate electron's and hole's clouding depending upon their respective work functions at top and bottom of source/drain electrode. Band-to-band-tunneling rate is similar on both sides of source-channel junctions, which increases ON state current. The analog performance parameters of DEDLTFET are investigated and using device simulation the demonstrated characteristics are compared with doping-less (DLTFET) and the conventional doped double gate TFET (DGTFET), such as transconductance (g(m)), transconductance to drain current ratio (g(m)/I-D), output-conductance (g(d)), output resistance (r(d)), early voltage (V-EA), intrinsic gain (A(V)), total gate capacitance (C-gg) and unity gain frequency (f(T)). From the simulation results, it is observed that DEDLTFET has significantly improved analog performance as compared to DGTFET and DLTFET.
机译:在本文中,我们提出了一种器件,并将其命名为双电极无掺杂TFET(DEDLTFET),其中考虑了源极和漏极顶部和底部的电极以增强导通状态电流和模拟性能。电荷等离子体技术用于根据电子/空穴在源/漏电极顶部和底部的各自功函数来产生电子的浑浊。在源通道结的两侧,带间隧道传输速率相似,这会增加导通状态电流。研究了DEDLTFET的模拟性能参数,并使用器件仿真将所展示的特性与无掺杂(DLTFET)和常规掺杂双栅极TFET(DGTFET)进行了比较,例如跨导(g(m)),跨导与漏极电流之比(g(m)/ ID),输出电导(g(d)),输出电阻(r(d)),早期电压(V-EA),固有增益(A(V)),总栅极电容(C -gg)和单位增益频率(f(T))。从仿真结果可以看出,与DGTFET和DLTFET相比,DEDLTFET具有显着改善的模拟性能。

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