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Design and Investigation of the High Performance Doping-Less TFET with Ge/Si0.6Ge0.4/Si Heterojunction

机译:Ge / Si0.6Ge0.4 / Si异质结高性能无掺杂TFET的设计与研究

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摘要

A high performance doping-less tunneling field effect transistor with Ge/Si0.6Ge0.4/Si heterojunction (H-DLTFET) is proposed in this paper. Compared to the conventional doping-less tunneling field effect transistor (DLTFET), the source and channel regions of H-DLTFET respectively use the germanium and Si0.6Ge0.4 materials to get the steeper energy band, which can also increase the electric field of source/channel tunneling junction. Meanwhile, the double-gate process is used to improve the gate-to-channel control. In addition, the effects of Ge content, electrode work functions, and device structure parameters on the performance of H-DLTFET are researched in detail, and then the above optimal device structure parameters can be obtained. Compared to the DLTFET, the simulation results show that the maximum on-state current, trans-conductance, and output current of H-DLTFET are all increased by one order of magnitude, whereas the off-state current is reduced by two orders of magnitude, so the switching ratio increase by three orders of magnitude. At the same time, the cut-off frequency and gain bandwidth product of H-DLTFET increase from 1.75 GHz and 0.23 GHz to 23.6 GHz and 4.69 GHz, respectively. Therefore, the H-DLTFET is more suitable for the ultra-low power integrated circuits.
机译:提出了一种具有Ge / Si0.6Ge0.4 / Si异质结(H-DLTFET)的高性能无掺杂隧道效应晶体管。与传统的无掺杂隧穿场效应晶体管(DLTFET)相比,H-DLTFET的源区和沟道区分别使用锗和Si0.6Ge0.4材料获得较陡的能带,这也可以增加硅的电场。源/通道隧道结。同时,双栅极工艺用于改善栅极到通道的控制。另外,详细研究了Ge含量,电极功函数和器件结构参数对H-DLTFET性能的影响,从而可以得到上述最佳器件结构参数。与DLTFET相比,仿真结果表明,H-DLTFET的最大导通电流,跨导和输出电流均增加了一个数量级,而截止状态电流则减小了两个数量级。 ,因此开关比增加了三个数量级。同时,H-DLTFET的截止频率和增益带宽积分别从1.75 GHz和0.23 GHz增加到23.6 GHz和4.69 GHz。因此,H-DLTFET更适合于超低功率集成电路。

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