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首页> 外文期刊>Journal of Applied Physics >Bandstructure effects in ultra-thin-body double-gate field effect transistor: A fullband analysis
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Bandstructure effects in ultra-thin-body double-gate field effect transistor: A fullband analysis

机译:超薄型双栅场效应晶体管的能带效应:全频带分析

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摘要

The properties of an n-channel ultra-thin-body (UTB) double-gate field effect transistor (DGFET), resulting from the bandstructure of the thin film Si channel, are discussed in this paper. The bandstructure has been calculated using a ten-orbital sp~3d~5s~* tight-binding method. A number of intrinsic properties including band gap, density of states, intrinsic carrier concentration, and parabolic effective mass have been derived from the calculated bandstructure. The spatial distributions of intrinsic carrier concentration and <100> effective mass, resulting from the wave functions of different contributing subbands, are analyzed. A self-consistent solution of coupled Poisson-Schrodinger equations is obtained taking the full bandstructure into account, which is then applied to analyze volume inversion. The spatial distribution of carriers over the channel of a DGFET has been calculated and its effect on effective mass and channel capacitance is discussed.
机译:本文讨论了由薄膜Si沟道的能带结构导致的n沟道超薄双体场效应晶体管(DGFET)的特性。使用十轨道sp〜3d〜5s〜*紧密结合方法计算了能带结构。从计算的能带结构中得出了许多固有性质,包括带隙,态密度,固有载流子浓度和抛物线有效质量。分析了不同贡献子带的波函数引起的本征载流子浓度和<100>有效质量的空间分布。在考虑全能带结构的情况下,获得了耦合的Poisson-Schrodinger方程的自洽解,然后将其用于分析体积反演。计算了DGFET沟道上载流子的空间分布,并讨论了其对有效质量和沟道电容的影响。

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  • 来源
    《Journal of Applied Physics》 |2008年第11期|682-690|共9页
  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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