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首页> 外文期刊>Japanese journal of applied physics >Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope
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Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope

机译:用于测量静电力的分析方法及触头电位差,不包括常规原子力显微镜的Casimir力的效果

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摘要

From the previous study by Inami and Sugimoto [Phys. Rev. Lett. 114, 246102 (2015)], it is known that a conventional frequency-modulation atomic force microscope (FM-AFM) system does not give an accurate contact potential difference (CPD) when it depends on the distance, and a novel method to measure an accurate CPD based on the energy dissipation was proposed. This method requires additional experimental setups to the conventional FM-AFM system to measure the energy dissipation. We propose the analytical method for the measurement of the distance dependence of the CPD with a conventional FM-AFM without additional setup which is based on evaluating the electrostatic force excluding the effect of the Casimir force and local charges. (C) 2019 The Japan Society of Applied Physics
机译:从先前的研究由Inami和Sugimoto [phys。 rev. lett。 114,246102(2015)]众所周知,当它取决于距离时,传统的频率调制原子力显微镜(FM-AFM)系统没有给出精确的接触电位差(CPD)和一种测量的新方法提出了一种基于能量耗散的精确CPD。该方法需要额外的实验设置到传统的FM-AFM系统以测量能量耗散。我们提出了用于测量CPD与传统FM-AFM的距离依赖性的分析方法,而无需额外的设置,其基于评估除了Casimir力和局部电荷的效果的静电力。 (c)2019年日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2019年第2019期|SIIA08.1-SIIA08.6|共6页
  • 作者

    Yoshida Naoki; Sueoka Kazuhisa;

  • 作者单位

    Hokkaido Univ Grad Sch Informat Sci & Technol Sapporo Hokkaido 0600814 Japan|Japan Soc Promot Sci Tokyo 1020083 Japan;

    Hokkaido Univ Grad Sch Informat Sci & Technol Sapporo Hokkaido 0600814 Japan;

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