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Impact of nanoscale patterning on Schottky contact resistance in AlGaN/GaN Schottky barrier diode

机译:纳米图形对AlGaN / GaN肖特基势垒二极管中肖特基接触电阻的影响

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摘要

The improvement of the Schottky contact resistance in an AlGaN/GaN Schottky barrier diode was investigated using dense nanoscale mesa holes. The 100 nm mesa hole array under the Schottky metal added a Schottky contact to the mesa edge with a length of 9.4 mu m/mu m(2). This decreased the contact resistance from 8.23 to 2.55 Omega.mm for a 15 x 100 mu m(2) AlGaN/GaN Schottky contact. Also, the transfer length of 12.5 mu m was reduced to 3.6 mu m by using the mesa array. The nanoscale mesa holes increased the Schottky current and enabled a narrow Schottky contact with high current density. The diode with a 2 x 100 mu m(2) Schottky contact that has mesa holes showed a current of 131 A/mm(2) at 3 V, which is 3.1 times higher than that of a conventional structure. (C) 2018 The Japan Society of Applied Physics
机译:使用致密的纳米台面孔研究了AlGaN / GaN肖特基势垒二极管中肖特基接触电阻的提高。在肖特基金属下方的100 nm台面孔阵列向台面边缘增加了肖特基接触,长度为9.4μm /μm(2)。对于15 x 100μm(2)AlGaN / GaN肖特基接触,这将接触电阻从8.23Ω减小到2.55Ω.mm.另外,通过使用台面阵列,将12.5μm的转印长度减小至3.6μm。纳米级台面孔增加了肖特基电流,并实现了具有高电流密度的窄肖特基接触。具有台面孔的2 x 100μm(2)肖特基接触的二极管在3 V电压下显示的电流为131 A / mm(2),这是常规结构的3.1倍。 (C)2018日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2018年第11期|111002.1-111002.4|共4页
  • 作者单位

    Elect & Telecommun Res Inst, Compound Semicond Div, Daejeon 34129, South Korea;

    Chonbuk Natl Univ, Semicond Phys Res Ctr, Sch Semicond & Chem Engn, Jeonju 54896, South Korea;

    Chonbuk Natl Univ, Semicond Phys Res Ctr, Sch Semicond & Chem Engn, Jeonju 54896, South Korea;

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