首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes >Optical Polarization Properties of InAs/GaAs Quantum Dot Semiconductor Optical Amplifier
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Optical Polarization Properties of InAs/GaAs Quantum Dot Semiconductor Optical Amplifier

机译:InAs / GaAs量子点半导体光放大器的光学偏振特性

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We have investigated cleaved-edge photoluminescence (PL) polarization properties of InAs/GaAs quantum dot (QD) traveling-type semiconductor optical amplifiers (SOAs). Transverse-electric (TE) and transverse magnetic (TM) mode PL intensities of the devices have been examined. TE-mode PL intensity of QD-SOA is observed to be much stronger than TM-mode. The results indicate that the valence band edge of the QDs is heavy-hole like. Temperature dependence on the PL polarization properties of QD-SOA has been carried out and analyzed. It is observed that an enhancement of TM-modc PL intensity of QD-SOA at higher temperature is due to the fact that the inhomogeneous thermal strain induced effect.
机译:我们已经研究了InAs / GaAs量子点(QD)行进式半导体光放大器(SOA)的裂边光致发光(PL)偏振特性。已经检查了器件的横向电(TE)和横向磁(TM)模式PL强度。观察到QD-SOA的TE模式PL强度比TM模式强得多。结果表明,量子点的价带边缘呈重孔状。温度对QD-SOA的PL极化特性的依赖性已经进行和分析。可以看出,在较高温度下QD-SOA的TM-modc PL强度增强是由于不均匀的热应变引起的效应。

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