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An accurate and simplified small signal parameter extraction method for GaN HEMT

机译:GaN HEMT的准确简化的小信号参数提取方法

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In this paper, development of a small signal model for 2 x 200 mu m GaN HEMT based on the conventional 20-element model is presented. The proposed model presents a direct parameter extraction algorithm, instead of the hybrid optimization approach, that provides simplification, accuracy, and less computational complexity. The extrinsic elements are extracted using a modified cold pinch-off condition while discarding the unwanted forward biasing of the gate. The negative drain to source capacitance C-ds is also observed in the ohmic region (for smaller V-DS). An excellent agreement found between the measured and modeled data for a wide range of frequencies and bias values shows the effectiveness of the proposed approach. The proposed modeling technique is validated with a good agreement between the achieved bias dependency of intrinsic parameter values and the respective theoretical parameter values.
机译:本文介绍了基于传统的20元模型的2×200μmGaN Hemt的小信号模型的开发。该建议的模型提出了一种直接参数提取算法,而不是混合优化方法,提供简化,准确性和计算复杂性较少。使用改进的冷夹断条件提取外部元素,同时丢弃栅极的不需要的向前偏置。在欧姆区域(对于较小的V-DS)也观察到负漏极到源电容C-DS。在多种频率和偏置值之间测量和建模数据之间的优秀协议显示了所提出的方法的有效性。所提出的建模技术以达到的偏置依赖性与内在参数值的偏置依赖性和相应的理论参数值之间的良好一致性验证。

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