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A first attempt to realize (multiple-QHE devices)-series array resistance standards

机译:首次尝试实现(多个QHE器件)系列阵列电阻标准

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Several chips composed of ten quantum Hall effect (QHE) devices placed in series by triple connections have been fabricated. The results obtained on one of these first arrays of quantized Hall resistances (QHR) open the possibility to realize novel QHR standards. The QHR on the i=2 plateau, 10/spl times/R/sub H/(i=2), was compared to R/sub H/(i=2) from a standard type QHE sample acting as a reference. The comparison results agreed to within parts in 10/sup 9/ for the measurements of a 1000 /spl Omega/ standard resistance. This work followed preliminary tests on the multiple connection techniques. In particular, the QHR on the i=2 plateau of a special QHE sample allowing the auto-series configuration with a double connection was found equal to 2/spl times/R/sub H/(i=2) within the total standard uncertainty of 4.4 parts in 10/sup 9/.
机译:已经制造了由十个通过三重连接串联放置的量子霍尔效应(QHE)器件组成的芯片。在这些第一批量化霍尔电阻(QHR)阵列之一上获得的结果为实现新型QHR标准提供了可能性。将i = 2平台上的QHR(10 / spl次/ R / sub H /(i = 2))与来自标准QHE样品的R / sub H /(i = 2)进行比较。比较结果以10 / sup 9 /的比例在部件内达成一致,以测量1000 / spl Omega /标准电阻。这项工作是在对多种连接技术进行初步测试之后进行的。特别是,发现在特殊QHE样品的i = 2平台上的QHR允许在双标准条件下进行自动串联配置,且在总标准不确定度内等于2 / spl次/ R / sub H /(i = 2)以10 / sup 9 /计的4.4件

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