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首页> 外文期刊>IEEE Transactions on Instrumentation and Measurement >Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays
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Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays

机译:使用SINIS Josephson阵列使用双重Josephson电压标准测量量化霍尔电阻的电阻标准

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摘要

To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-k/spl Omega/ standard resistors can be linked to a quantized Hall resistance (i=2, 12.9 k/spl Omega/) with an expanded uncertainty (k=2) of less than 4 parts in 10/sup 9/.
机译:为了高精度确定任意电阻比,已经建立了基于双重约瑟夫森电压标准的测量系统。结果表明,通过该系统,可以将10-k / spl Omega /标准电阻器连接到量化的霍尔电阻(i = 2,12.9 k / spl Omega /),不确定度(k = 2)为10 / sup 9 /中少于4个零件。

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