A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

摘要

A new measuring technique with a 1 $muhbox{s}$ measuring delay and a direct $V_{T}$ determination has been employed. The response to stress times as short as 100 $muhbox{s}$ to $hbox{10}^{5}$ s has been studied as well as recovery over 12 decades in time. These experimental data allow a meaningful comparison to theory. Degradation data cut be precisely fitted to a simple physical model with 3 parameters thus enabling a reliable lifetime prediction from stress times below $hbox{10}^{4}$ s.