首页> 外文期刊>IEEE transactions on device and materials reliability >Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification
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Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification

机译:汽车应用高温资格测试期间金铝键合线的降解机理:通过工艺改进提高质量

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摘要

Several package families used in automotive environment were aged at different high temperatures. The purpose was to better characterize the predominant failure mechanism of ball bonds and to identify the most influential technological parameters on it. The mechanism is related to the Kirkendall effect, which is a consequence of the Au-Al intermetallic phase growth. For identical materials, the package geometry plays a crucial role: experimental results are confirmed by both analytical model and finite-element simulations. To extend the qualification domain to the biggest package size, the wire bonding process must be improved. In particular, the use of Au-1 wt.% Pd instead of pure Au is investigated, showing that this alloy permits to decrease the Au-Al intermetallic growth and, hence, to increase the lifetime.
机译:汽车环境中使用的几种封装系列在不同的高温下老化。目的是更好地表征球形键合的主要失效机理,并确定对其最有影响力的技术参数。该机制与柯肯德尔效应有关,后者是金铝金属互化物相生长的结果。对于相同的材料,包装的几何形状起着至关重要的作用:分析模型和有限元模拟都证实了实验结果。为了将鉴定范围扩展到最大的封装尺寸,必须改进引线键合工艺。特别地,研究了使用Au-1重量%的Pd代替纯Au,这表明该合金允许减少Au-Al金属间化合物的生长,从而延长寿命。

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