ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

摘要

In this paper, we present a new chip-level electrothermal timing simulator for CMOS VLSI circuits. Given the chip layout, the packaging specification, and the periodic input signal pattern, it finds the on-chip steady-state temperature profile and the resulting circuit performance. A tester chip has been designed for verification of ILLIADS-T, and very good agreement between simulation and experiment was found. Using this electrothermal simulator, temperature-dependent reliability and timing problems of VLSI circuits can be accurately identified.