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Electrical Performance Advancement in SiC Power Module Package Design With Kelvin Drain Connection and Low Parasitic Inductance

机译:具有开尔文漏极连接和低寄生电感的SiC功率模块封装设计在电气性能方面的进步

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摘要

Silicon carbide (SiC) power modules are promising for high-power applications because of the high breakdown voltage, high operation temperature, low ON-resistance, and fast switching speed. However, the large parasitic inductance in existing package designs results in compromised performance, i.e., long blanking time in the desaturation protection scheme and large overvoltage spikes during the switching transient. Consequently, the benefits of SiC devices are often not fully utilized in practical applications. This paper deals with these two issues and aims at improving the electrical performance of the existing SiC module package. Specifically, a package design with Kelvin drain-to-source connection is first proposed to minimize the blanking time. More than 99% reduction of blanking time is achieved experimentally compared to the conventional package design. Second, a low parasitic inductance package with double-side cooling is proposed to allow the fast switching speed of SiC devices without sacrificing the thermal performance. A power loop inductance of 1.63 nH is realized from Q3D simulation. Verified by the experiment, more than 60% reduction of power loop inductance is achieved in comparison to a previously designed baseline module. At 0-Omega external gate resistance, the turn-off voltage spike is less than 9% of the dc-link voltage under the rated load condition.
机译:碳化硅(SiC)电源模块具有较高的击穿电压,较高的工作温度,较低的导通电阻和快速的开关速度,因此有望用于大功率应用。然而,现有封装设计中的大寄生电感导致性能下降,即,去饱和保护方案中的消隐时间长,并且在开关瞬变期间产生大的过电压尖峰。因此,在实际应用中通常无法充分利用SiC器件的优势。本文针对这两个问题,旨在改善现有SiC模块封装的电气性能。具体而言,首先提出了采用开尔文漏极至源极连接的封装设计,以最大程度地减少消隐时间。与传统的封装设计相比,通过实验可将消隐时间减少99%以上。其次,提出了一种具有双侧冷却功能的低寄生电感封装,以在不牺牲热性能的情况下实现SiC器件的快速开关速度。通过Q3D仿真可实现1.63 nH的电源环路电感。经实验验证,与之前设计的基准模块相比,功率环路电感降低了60%以上。在0Ω外部栅极电阻下,在额定负载条件下,关断电压尖峰小于直流链路电压的9%。

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