Modeling of short geometry polycrystalline-silicon thin-film transistor

摘要

An accurate model for the device characteristics of a short geometry polysilicon thin-film transistor (poly-Si TFT) is developed. The proposed channel length dependent threshold voltage and the current-voltage (I-V) characteristics determined are in excellent agreement with experimental results confirming the validity of this model. The impact of the grain size on device characteristics is also shown.