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Asymmetric Halo CMOSFET to Reduce Static Power Dissipation With Improved Performance

机译:非对称Halo CMOSFET通过改善的性能来减少静态功耗

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In this paper, we show the benefits of using asymmetric halo (AH, different source, and drainside halo doping concentrations) MOSFETs over conventional symmetric halo (SH) MOSFETs to reduce static leakage in sub-50-nm CMOS circuits. Device doping profiles have been optimized to achieve minimum leakage at iso on-current. Results show a 61 % reduction in static leakage in AH nMOS transistor and a 90% reduction in static leakage in AH pMOS transistor because of reduced band-to-band tunneling current in the reverse biased drain-substrate junctions. In an AH CMOS inverter, static power dissipation is 19% less than in an SH CMOS inverter. Propagation delay in a three-stage ring oscillator reduces by 11% because of reduced drainside halo doping and hence reduced drain junction capacitance. Further comparisons have been made on two-input NAND and NOR CMOS logic gates.
机译:在本文中,我们展示了使用非对称光晕(AH,不同的源极和漏极侧光晕掺杂浓度)MOSFET优于传统的对称光晕(SH)MOSFET的优点,以减少50nm以下CMOS电路中的静态泄漏。器件掺杂曲线已得到优化,以在等通电流下实现最小泄漏。结果显示,由于反向偏置的漏极-衬底结中的带间隧穿电流减小,AH nMOS晶体管的静态泄漏减少了61%,AH pMOS晶体管的静态泄漏减少了90%。在AH CMOS反相器中,静态功耗比SH CMOS反相器少19%。由于减少了漏极侧的晕圈掺杂,因此减少了漏极结电容,三级环形振荡器的传播延迟减少了11%。在两输入NAND和NOR CMOS逻辑门上进行了进一步的比较。

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