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Interconnect Modeling: A Physical Design Perspective

机译:互连建模:物理设计的角度

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Variability, reliability, and design size are becoming major difficulties in system-on-a-chip (SoC) designs as the scaling of semiconductor technology advances. Techniques for interconnect modeling and analysis in designing advanced SoCs are discussed from the design-automation point of view. Importance of interconnect modeling in modern chip-design flows is first summarized. State-of-the-art physical-design techniques for parasitic extraction, signal-integrity analysis, and timing analysis (which are commonly executed throughout the final verification of physical design) are then reviewed. The extraction and analysis require the most accurate process information and modeling. Requests with respect to the manufacturing–design interface are discussed, and the authors' perspective concerning future SoC physical designs is addressed with emphasis on interactions between manufacturing and design technologies.
机译:随着半导体技术的发展,可变性,可靠性和设计尺寸正成为片上系统(SoC)设计的主要难题。从设计自动化的角度讨论了设计高级SoC时进行互连建模和分析的技术。首先总结了互连建模在现代芯片设计流程中的重要性。然后,对用于寄生提取,信号完整性分析和时序分析(通常在整个物理设计的最终验证中普遍执行)的最新物理设计技术进行了回顾。提取和分析需要最准确的过程信息和建模。讨论了与制造设计接口有关的请求,并针对作者对未来SoC物理设计的观点,重点强调了制造和设计技术之间的相互作用。

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