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首页> 外文期刊>Electron Devices, IEEE Transactions on >Impact of High-Mobility Materials on the Performance of Near- and Sub-Threshold CMOS Logic Circuits
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Impact of High-Mobility Materials on the Performance of Near- and Sub-Threshold CMOS Logic Circuits

机译:高迁移率材料对近阈值和亚阈值CMOS逻辑电路性能的影响

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摘要

This paper studies the impact of high-mobility materials on the performance and energy efficiency of near- and sub-threshold CMOS logic circuits by means of analytical equations and experimental data on SiGe pMOSFETs. The introduction of high-mobility materials is shown to improve the energy-performance trade-off in near-threshold circuits more than in above-threshold circuits, since the benefits of higher mobility are degraded at higher longitudinal and transversal electric fields. On the other hand, results show that high-mobility materials do not exhibit any advantage in terms of the energy-performance trade-off in sub-threshold logic circuits. This is explained by the fact that the benefits brought by the larger mobility of SiGe or other alternative materials can be obtained by tuning the threshold voltage of conventional Si devices.
机译:本文通过在SiGe pMOSFET上的解析方程和实验数据,研究了高迁移率材料对近阈值和亚阈值CMOS逻辑电路的性能和能效的影响。由于在较高的纵向和横向电场中,较高迁移率的优势会降低,因此高迁移率材料的引入已显示出比阈值之上的电路更能改善近阈值电路的能量性能折衷。另一方面,结果表明,高迁移率材料在亚阈值逻辑电路的能量性能折衷方面没有表现出任何优势。这可以通过以下事实来解释:可以通过调整常规Si器件的阈值电压来获得更大的SiGe迁移率或其他替代材料带来的好处。

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