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Design of ESD Protection Device for src='/images/tex/30609.gif' alt='K!/!Ka'> -Band Applications in Nanoscale CMOS Process

机译:用于 src =“ / images / tex / 30609.gif” alt =“ K!/!Ka”> -纳米CMOS工艺中的波段应用的ESD保护装置的设计

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摘要

An inductor-assisted silicon-controlled rectifier (LASCR) device is proposed to protect the gigahertz ICs in nanoscale CMOS technologies from electrostatic discharge (ESD) damages. The LASCR with the assistance of inductor can provide the bidirectional ESD current paths and fine-tune the high-frequency performances. Each LASCR test device has been implemented in a compact size of . The LASCR test devices have been successfully verified in a silicon chip to achieve 4–7.5 kV human-body-model ESD robustness with 1–3-dB loss in -band (18–40 GHz). With the better performances, the proposed ESD protection device is very suitable for -band applications.
机译:提出了一种电感器辅助可控硅(LASCR)器件,以保护纳米CMOS技术中的千兆赫IC免受静电放电(ESD)的损害。借助电感器的LASCR可以提供双向ESD电流路径,并微调高频性能。每个LASCR测试设备都以的紧凑尺寸实现。 LASCR测试设备已在硅芯片上成功验证,可实现4–7.5 kV人体模型ESD鲁棒性,且带内(18–40 GHz)损耗1-3 dB。所提出的ESD保护器件具有更好的性能,非常适合于频段应用。

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