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Enhanced Electrical Performance and Heat Dissipation in AlGaN/GaN Schottky Barrier Diodes Using Hybrid Tri-anode Structure

机译:使用混合三阳极结构增强AlGaN / GaN肖特基势垒二极管的电性能和散热

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摘要

Enhanced performance in AlGaN/GaN Schottky barrier diodes (SBDs) is investigated using a nanowire hybrid tri-anode structure that integrates 3-D Schottky junctions with tri-gate transistors. The fabricated SBDs presented an increased output current density with an improved linearity, above 1 A/mm at 5 V when normalized by an effective anode width, over three orders of magnitude lower reverse leakage current and superior heat dissipation. The sidewall Schottky contacts reduced the turn-on voltage and eliminated the nonideality caused by the AlGaN barrier. The large surface area of the tri-gate architecture greatly enhanced heat dissipation and largely reduced the average temperature as well as thermal resistance of the integrated tri-gate transistors. The trench conduction near SiO2/GaN interface, formed under forward bias at both sidewalls and bottom of nanowire trenches, compensated part of the self-heating degradation and improved the output linearity of the device. Optimal design for the tri-anode structure, based on a model of critical filling factor, was proposed to surmount the issue of partial removal of 2-D electron gas (2DEG), unveiling the potential of nanostructured GaN devices to achieve comparable or even larger output current than counterpart planar devices.
机译:使用将3-D肖特基结与三栅晶体管集成在一起的纳米线混合三阳极结构,研究了AlGaN / GaN肖特基势垒二极管(SBD)的增强性能。当通过有效阳极宽度归一化时,所制造的SBD呈现出更高的输出电流密度和更高的线性度,在5 V时高于1 A / mm,反向泄漏电流降低了三个数量级,并且散热出色。侧壁肖特基接触降低了导通电压并消除了由AlGaN势垒引起的非理想性。三栅架构的大表面积极大地增强了散热,并大大降低了集成三栅晶体管的平均温度和热阻。在纳米线沟槽的侧壁和底部的正向偏置下形成的,靠近SiO2 / GaN界面的沟槽传导,补偿了部分自热退化并改善了器件的输出线性。提出了基于临界填充因子模型的三阳极结构的最佳设计,以解决部分去除二维电子气(2DEG)的问题,从而揭示了纳米结构GaN器件实现可比甚至更大的潜力输出电流要比对应的平面设备高。

著录项

  • 来源
    《IEEE Transactions on Electron Devices》 |2016年第9期|3614-3619|共6页
  • 作者单位

    Power and Wide-Band-Gap Electronics Research Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland;

    Power and Wide-Band-Gap Electronics Research Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland;

    Power and Wide-Band-Gap Electronics Research Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland;

    Power and Wide-Band-Gap Electronics Research Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Logic gates; Aluminum gallium nitride; Wide band gap semiconductors; HEMTs; Gallium nitride; Linearity;

    机译:逻辑门;氮化铝镓;宽带隙半导体;HEMT;氮化镓;线性;

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