机译:考虑失败位置影响的风电转换器中剩余寿命的IGBT模块的评估
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Hunan Univ Coll Elect & Informat Engn Changsha 12569 Peoples R China;
Chongqing Univ State Key Lab Power Transmiss Equipment & Syst Se Chongqing 400044 Peoples R China;
Junctions; Thermal resistance; Fatigue; Insulated gate bipolar transistors; Stress; Multichip modules; Mathematical model; Failure location; fatigue accumulative effect; insulated gate bipolar transistor (IGBT); lifetime estimation; thermal model;
机译:考虑环境温度的风力发电机功率变换器系统中IGBT模块的寿命估算
机译:用于IGBT电源模块的剩余有用寿命预后的引线接触降解模型
机译:电力电子变流器系统中功率IGBT模块故障的研究与处理方法
机译:考虑不同故障站点的效果,风电转换器IGBT模块的可靠性评估
机译:汽车电力转换系统IGBT的健康监测
机译:使用两阶段粒子群优化的级联光伏转换器模块的最大功率点跟踪
机译:用于IGBT电源模块的剩余有用寿命预后的引线接触降解模型