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Parallel Simulation of Fully Coupled Electrothermal Processes in Large-Scale Phase-Change Memory Arrays

机译:大规模相变存储阵列中全耦合电热过程的并行仿真

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Numerical simulation of fully coupled electrothermal processes in phase-change memory (PCM) arrays is performed in this article. For realizing the ability in simulating the electrothermal responses of large-scale PCM arrays, an in-house parallel simulator based on domain decomposition method (DDM) and time-domain finite element method (FETD) is developed, with its performance evaluated in terms of accuracy and scalability. Then, thermal crosstalk in the PCM array is investigated using the developed simulator, and a diamond layer is introduced to suppress thermal crosstalk. Furthermore, the scaling effects of PCM arrays on their electrothermal performance are examined. A scheme for multibit PCM design is proposed, and the electrothermal characteristics of proposed 2-bit PCM cells and arrays are studied numerically.
机译:本文对相变存储器(PCM)阵列中完全耦合的电热过程进行了数值模拟。为了实现模拟大型PCM阵列电热响应的能力,开发了一种基于域分解方法(DDM)和时域有限元方法(FETD)的内部并行模拟器,并根据以下方面评估了其性能:准确性和可扩展性。然后,使用开发的模拟器研究PCM阵列中的热串扰,并引入金刚石层以抑制热串扰。此外,检查了PCM阵列对其电热性能的缩放效应。提出了一种多位PCM设计方案,并对所提出的2位PCM单元和阵列的电热特性进行了数值研究。

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